Highly Efficient Fault Detection Schemes for AES S-Box Based on Redundant GF Arithmetic

DAI Qiang, DAI Zi-bin, LI Wei

ACTA ELECTRONICA SINICA ›› 2018, Vol. 46 ›› Issue (11) : 2650-2659.

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ACTA ELECTRONICA SINICA ›› 2018, Vol. 46 ›› Issue (11) : 2650-2659. DOI: 10.3969/j.issn.0372-2112.2018.11.012

Highly Efficient Fault Detection Schemes for AES S-Box Based on Redundant GF Arithmetic

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2018, 46(11): 2650-2659. https://doi.org/10.3969/j.issn.0372-2112.2018.11.012

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