New Type of Rough Probabilistic Truth Degree of Formulae in Rough Logic

ZUO Wei-bing, LI Hui-hui, QIAN Li

ACTA ELECTRONICA SINICA ›› 2019, Vol. 47 ›› Issue (5) : 1174-1179.

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ACTA ELECTRONICA SINICA ›› 2019, Vol. 47 ›› Issue (5) : 1174-1179. DOI: 10.3969/j.issn.0372-2112.2019.05.026

New Type of Rough Probabilistic Truth Degree of Formulae in Rough Logic

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2019, 47(5): 1174-1179. https://doi.org/10.3969/j.issn.0372-2112.2019.05.026

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