Sample Space Based on Multi-level High Dimensional Feature Representation Micro-fault Diagnosis

ZHANG Cai-xia, WANG Zi-han, WEN Cheng-lin, LIU Guo-wen, YU Wei

ACTA ELECTRONICA SINICA ›› 2020, Vol. 48 ›› Issue (8) : 1647-1654.

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ACTA ELECTRONICA SINICA ›› 2020, Vol. 48 ›› Issue (8) : 1647-1654. DOI: 10.3969/j.issn.0372-2112.2020.08.026

Sample Space Based on Multi-level High Dimensional Feature Representation Micro-fault Diagnosis

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2020, 48(8): 1647-1654. https://doi.org/10.3969/j.issn.0372-2112.2020.08.026

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