Survey on Mutation Testing of Concurrent Programs

TIAN Tian, GONG Dun-wei

ACTA ELECTRONICA SINICA ›› 2020, Vol. 48 ›› Issue (11) : 2267-2277.

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ACTA ELECTRONICA SINICA ›› 2020, Vol. 48 ›› Issue (11) : 2267-2277. DOI: 10.3969/j.issn.0372-2112.2020.11.025

Survey on Mutation Testing of Concurrent Programs

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2020, 48(11): 2267-2277. https://doi.org/10.3969/j.issn.0372-2112.2020.11.025

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