The Study for Charge Leakage on The Floating-gate of FLOTOX EEPROM

YU Zong-guang;LU Feng;XU Zheng;YE Shou-yin;HUANG Wei;WANG Wan-ye;XU Ju-yan

ACTA ELECTRONICA SINICA ›› 2000, Vol. 28 ›› Issue (5) : 90-91.

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ACTA ELECTRONICA SINICA ›› 2000, Vol. 28 ›› Issue (5) : 90-91.
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The Study for Charge Leakage on The Floating-gate of FLOTOX EEPROM

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2000, 28(5): 90-91.

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