A New Approach for Fast Identification of Flaw in Metallic Material

A New Approach for Fast Identification of Flaw in Metallic Material

XING Ling-ling;XI Bao-feng;SHENG Jian-ni

ACTA ELECTRONICA SINICA ›› 2000, Vol. 28 ›› Issue (8) : 16-19.

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PDF(275 KB)

ACTA ELECTRONICA SINICA ›› 2000, Vol. 28 ›› Issue (8) : 16-19.

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A New Approach for Fast Identification of Flaw in Metallic Material

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2000, 28(8): 16-19.

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