A New Approach for Fast Identification of Flaw in Metallic Material

XING Ling-ling;XI Bao-feng;SHENG Jian-ni

Acta Electronica Sinica ›› 2000, Vol. 28 ›› Issue (8) : 16-19.

PDF(275 KB)
CIE Homepage  |  Join CIE  |  Login CIE  |  中文 
PDF(275 KB)
Acta Electronica Sinica ›› 2000, Vol. 28 ›› Issue (8) : 16-19.
论文

A New Approach for Fast Identification of Flaw in Metallic Material

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2000, 28(8): 16-19

References

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}
PDF(275 KB)

Accesses

Citation

Detail

Sections
Recommended

/