The Breakdown Character of Thin Oxide Film and Critical Trap Density

The Breakdown Character of Thin Oxide Film and Critical Trap Density

LIN Li-jin;ZHANG Min

ACTA ELECTRONICA SINICA ›› 2000, Vol. 28 ›› Issue (8) : 59-62.

PDF(345 KB)

PDF(345 KB)

ACTA ELECTRONICA SINICA ›› 2000, Vol. 28 ›› Issue (8) : 59-62.

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The Breakdown Character of Thin Oxide Film and Critical Trap Density

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2000, 28(8): 59-62.

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