The Method of Defect Model Parameter Extraction for IC Functional Yield Estimation

The Method of Defect Model Parameter Extraction for IC Functional Yield Estimation

HAO Yue;MA Pei-jun;ZHANG Wei-dong;ZHAO Tian-xu

ACTA ELECTRONICA SINICA ›› 2000, Vol. 28 ›› Issue (8) : 76-78.

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PDF(238 KB)

ACTA ELECTRONICA SINICA ›› 2000, Vol. 28 ›› Issue (8) : 76-78.

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The Method of Defect Model Parameter Extraction for IC Functional Yield Estimation

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2000, 28(8): 76-78.

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