Study of Substrate Hot Electron Enhanced Breakdown Characteristics of Thin SiO2

LIU Hong-xia;HAO Yue;HUANG Tao;FANG Jian-ping

ACTA ELECTRONICA SINICA ›› 2001, Vol. 29 ›› Issue (11) : 1468-1470.

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ACTA ELECTRONICA SINICA ›› 2001, Vol. 29 ›› Issue (11) : 1468-1470.
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Study of Substrate Hot Electron Enhanced Breakdown Characteristics of Thin SiO2

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2001, 29(11): 1468-1470.

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