Relation Between Reliability and Yield of IC's Based on Discrete Model

Relation Between Reliability and Yield of IC's Based on Discrete Model

ZHAO Tian-xu;HAO Yue;CHEN Tai-feng;MA Pei-jun

ACTA ELECTRONICA SINICA ›› 2001, Vol. 29 ›› Issue (11) : 1515-1518.

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ACTA ELECTRONICA SINICA ›› 2001, Vol. 29 ›› Issue (11) : 1515-1518.

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Relation Between Reliability and Yield of IC's Based on Discrete Model

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2001, 29(11): 1515-1518.

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