Study on the Influence for Structure Parameters on the Hot-Carrier-Effect Immunity in NMOSFET

Study on the Influence for Structure Parameters on the Hot-Carrier-Effect Immunity in NMOSFET

REN Hong-xia;HAO Yue;XU Dong-gang

ACTA ELECTRONICA SINICA ›› 2001, Vol. 29 ›› Issue (2) : 160-163.

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PDF(209 KB)

ACTA ELECTRONICA SINICA ›› 2001, Vol. 29 ›› Issue (2) : 160-163.

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Study on the Influence for Structure Parameters on the Hot-Carrier-Effect Immunity in NMOSFET

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2001, 29(2): 160-163.

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