New Approach for Reducing the Multiple Reflection Errors in Planar Near-Field Measurement

ZHANG Fu-shun;JIAO Yong-chang;LIU Qi-zhong;MAO Nai-hong

ACTA ELECTRONICA SINICA ›› 2001, Vol. 29 ›› Issue (7) : 1003-1005.

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ACTA ELECTRONICA SINICA ›› 2001, Vol. 29 ›› Issue (7) : 1003-1005.
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New Approach for Reducing the Multiple Reflection Errors in Planar Near-Field Measurement

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