
New Approach for Reducing the Multiple Reflection Errors in Planar Near-Field Measurement
ZHANG Fu-shun;JIAO Yong-chang;LIU Qi-zhong;MAO Nai-hong
ACTA ELECTRONICA SINICA ›› 2001, Vol. 29 ›› Issue (7) : 1003-1005.
New Approach for Reducing the Multiple Reflection Errors in Planar Near-Field Measurement
{{custom_ref.label}} |
{{custom_citation.content}}
{{custom_citation.annotation}}
|
/
〈 |
|
〉 |