Y/R Model of Integrated Circuits Based on the Open Circuit Fault of Interconnections

Y/R Model of Integrated Circuits Based on the Open Circuit Fault of Interconnections

ZHAO Tian-xu;HAO Yue;MA Pei-jun

ACTA ELECTRONICA SINICA ›› 2002, Vol. 30 ›› Issue (11) : 1707-1710.

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PDF(167 KB)

ACTA ELECTRONICA SINICA ›› 2002, Vol. 30 ›› Issue (11) : 1707-1710.

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Y/R Model of Integrated Circuits Based on the Open Circuit Fault of Interconnections

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2002, 30(11): 1707-1710.

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