The Analysis of Latch Up Characteristics in High Temperature CMOSIntegrated Circuits

KE Dao-ming;CHEN Jun-ning;ZHUO Guo-xiang;DAI Yue-hua;GAO Shan;MENG Jian;ZAO Hai-feng

ACTA ELECTRONICA SINICA ›› 2002, Vol. 30 ›› Issue (12) : 1894-1896.

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ACTA ELECTRONICA SINICA ›› 2002, Vol. 30 ›› Issue (12) : 1894-1896.
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The Analysis of Latch Up Characteristics in High Temperature CMOSIntegrated Circuits

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2002, 30(12): 1894-1896.

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