Electrical Characteristics of 3.4nm Gate Oxide
XU Xiao-yan;TAN Jing-rong;GAO Wen-yu;HUANG Ru;TIAN Da-yu;ZHANG Xing
Acta Electronica Sinica ›› 2002, Vol. 30 ›› Issue (2) : 269-270.
Electrical Characteristics of 3.4nm Gate Oxide
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