Work Function of Tungsten Carbide Thin Film Calculated Using Field Emission Microscopy

SUN Jian-ping;ZHANG Zhao-xiang;HOU Shi-min;ZHANG Geng-min;ZHAO Xing-yu;LIU Wei-min;XUE Zeng-quan

ACTA ELECTRONICA SINICA ›› 2002, Vol. 30 ›› Issue (5) : 655-657.

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ACTA ELECTRONICA SINICA ›› 2002, Vol. 30 ›› Issue (5) : 655-657.
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Work Function of Tungsten Carbide Thin Film Calculated Using Field Emission Microscopy

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2002, 30(5): 655-657.

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