Study on Pulse Stress Enhanced Hot-Carrier Effects in NMOSFET's

Study on Pulse Stress Enhanced Hot-Carrier Effects in NMOSFET's

LIU Hong-xia;HAO Yue

ACTA ELECTRONICA SINICA ›› 2002, Vol. 30 ›› Issue (5) : 658-660.

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PDF(106 KB)

ACTA ELECTRONICA SINICA ›› 2002, Vol. 30 ›› Issue (5) : 658-660.

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Study on Pulse Stress Enhanced Hot-Carrier Effects in NMOSFET's

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2002, 30(5): 658-660.

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