Study on Extraction of Stress-Induced Interface Traps in MOSFETs by Linear Cofactor Differernce Subthreshold Voltage Peak Technique

HE Jin;ZHANG Xing;HUANG Ru;WANG Yang-yuan

ACTA ELECTRONICA SINICA ›› 2002, Vol. 30 ›› Issue (8) : 1108-1110.

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ACTA ELECTRONICA SINICA ›› 2002, Vol. 30 ›› Issue (8) : 1108-1110.
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Study on Extraction of Stress-Induced Interface Traps in MOSFETs by Linear Cofactor Differernce Subthreshold Voltage Peak Technique

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2002, 30(8): 1108-1110.

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