Software Complexity and Value of Test Cases Satisfied with Testing Criterion

WU Ji, JIN Mao-zhong, LIU Chao

ACTA ELECTRONICA SINICA ›› 2002, Vol. 30 ›› Issue (S1) : 2166-2168.

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ACTA ELECTRONICA SINICA ›› 2002, Vol. 30 ›› Issue (S1) : 2166-2168.

Software Complexity and Value of Test Cases Satisfied with Testing Criterion

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2002, 30(S1): 2166-2168.

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