Study on Applying Independent Component Analysis to Remove Blink Artifacts and Power Noise in EEG WAN Bai-kun,ZHU Xin,YANG Chun-mei,GAO-Yang

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ACTA ELECTRONICA SINICA ›› 2003, Vol. 31 ›› Issue (10) : 1571-1574.

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Study on Applying Independent Component Analysis to Remove Blink Artifacts and Power Noise in EEG WAN Bai-kun,ZHU Xin,YANG Chun-mei,GAO-Yang

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2003, 31(10): 1571-1574.

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