Correlation between Frequency Exponent of 1/f γ Noise and Electromigration Failure in VLSI Interconnections
DU Lei;ZHUANG Yi-qi;XUE Li-jun
Acta Electronica Sinica ›› 2003, Vol. 31 ›› Issue (2) : 183-185.
Correlation between Frequency Exponent of 1/f γ Noise and Electromigration Failure in VLSI Interconnections
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