Correlation between Frequency Exponent of 1/f γ Noise and Electromigration Failure in VLSI Interconnections

DU Lei;ZHUANG Yi-qi;XUE Li-jun

ACTA ELECTRONICA SINICA ›› 2003, Vol. 31 ›› Issue (2) : 183-185.

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ACTA ELECTRONICA SINICA ›› 2003, Vol. 31 ›› Issue (2) : 183-185.
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Correlation between Frequency Exponent of 1/f γ Noise and Electromigration Failure in VLSI Interconnections

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2003, 31(2): 183-185.

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