State of the Art on Study of Parametric Yield and Its Optimization for VLSI

State of the Art on Study of Parametric Yield and Its Optimization for VLSI

HAO Yue, JING Ming-e, MA Pei-jun

ACTA ELECTRONICA SINICA ›› 2003, Vol. 31 ›› Issue (S1) : 1971-1974.

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PDF(446 KB)

ACTA ELECTRONICA SINICA ›› 2003, Vol. 31 ›› Issue (S1) : 1971-1974.

State of the Art on Study of Parametric Yield and Its Optimization for VLSI

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2003, 31(S1): 1971-1974.

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