Survey on Path-Wise Automatic Generation of Test Data

Survey on Path-Wise Automatic Generation of Test Data

SHAN Jin-Hui;WANG Ji;QI Zhi-Chang

ACTA ELECTRONICA SINICA ›› 2004, Vol. 32 ›› Issue (1) : 109-113.

PDF(284 KB)

PDF(284 KB)

ACTA ELECTRONICA SINICA ›› 2004, Vol. 32 ›› Issue (1) : 109-113.

论文

Survey on Path-Wise Automatic Generation of Test Data

{{article.zuoZhe_EN}}

Author information +

History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

Download Citations

{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2004, 32(1): 109-113.

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}

{{article.copyrightLicense_en}}

PDF(284 KB)

Accesses

Citation

Detail

Sections

Recommended

/

〈

〉