Modeling and Characterization of Deep-Submicron MOSFET with Short-Channel Effect Based on BSIMTM

ZHAO Yang;PARKE Stephen;BURKE Franklyn

ACTA ELECTRONICA SINICA ›› 2004, Vol. 32 ›› Issue (5) : 841-844.

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ACTA ELECTRONICA SINICA ›› 2004, Vol. 32 ›› Issue (5) : 841-844.
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Modeling and Characterization of Deep-Submicron MOSFET with Short-Channel Effect Based on BSIMTM

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2004, 32(5): 841-844.

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