Effect of Helical Slow-Wave Structure Parameter Variations on TWT Cold-Test Characteristics

Effect of Helical Slow-Wave Structure Parameter Variations on TWT Cold-Test Characteristics

LI Shi;LIU Wei;SU Xiao-bao;YIN He-jun

ACTA ELECTRONICA SINICA ›› 2004, Vol. 32 ›› Issue (9) : 1511-1514.

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PDF(147 KB)

ACTA ELECTRONICA SINICA ›› 2004, Vol. 32 ›› Issue (9) : 1511-1514.

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Effect of Helical Slow-Wave Structure Parameter Variations on TWT Cold-Test Characteristics

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2004, 32(9): 1511-1514.

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