Estimation of Early-Life Reliability Based on Integrated-Circuit Yield Model

Estimation of Early-Life Reliability Based on Integrated-Circuit Yield Model

ZHAO Tian-xu, DUAN Xu-chao, HAO Yue

ACTA ELECTRONICA SINICA ›› 2005, Vol. 33 ›› Issue (11) : 1965-1968.

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PDF(236 KB)

ACTA ELECTRONICA SINICA ›› 2005, Vol. 33 ›› Issue (11) : 1965-1968.

Estimation of Early-Life Reliability Based on Integrated-Circuit Yield Model

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2005, 33(11): 1965-1968.

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