Reliability Estimate of Metallized-Film Pulse Capacitor from Degradation Data
ZHAO Jian-yin, LIU Fang, SUN Quan, ZHOU Jing-lun
Acta Electronica Sinica ›› 2005, Vol. 33 ›› Issue (2) : 378-381.
Reliability Estimate of Metallized-Film Pulse Capacitor from Degradation Data
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