Fast Inductance and Resistance Extraction of 3-D VLSI Interconnects Based on the Method of K Element

WEI Hong-chuan, YU Wen-jian, YANG Liu, WANG Ze-yi

ACTA ELECTRONICA SINICA ›› 2005, Vol. 33 ›› Issue (8) : 1365-1369.

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ACTA ELECTRONICA SINICA ›› 2005, Vol. 33 ›› Issue (8) : 1365-1369.

Fast Inductance and Resistance Extraction of 3-D VLSI Interconnects Based on the Method of K Element

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2005, 33(8): 1365-1369.

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