A Study on Test & Measurement of the Radiated Field by ESD

ZHU Chang-qing, LIU Shang-he, WEI Ming

ACTA ELECTRONICA SINICA ›› 2005, Vol. 33 ›› Issue (9) : 1702-1705.

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ACTA ELECTRONICA SINICA ›› 2005, Vol. 33 ›› Issue (9) : 1702-1705.

A Study on Test & Measurement of the Radiated Field by ESD

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2005, 33(9): 1702-1705.

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