Techniques of Leakage Current Optimization Based on Don’t Care Bits in Test Vectors

Techniques of Leakage Current Optimization Based on Don’t Care Bits in Test Vectors

WANG Wei, HAN Yin-he, LI Xiao-wei, ZHANG You-sheng

ACTA ELECTRONICA SINICA ›› 2006, Vol. 34 ›› Issue (2) : 282-286.

PDF(220 KB)

PDF(220 KB)

ACTA ELECTRONICA SINICA ›› 2006, Vol. 34 ›› Issue (2) : 282-286.

Techniques of Leakage Current Optimization Based on Don’t Care Bits in Test Vectors

{{article.zuoZhe_EN}}

Author information +

History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

Download Citations

{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2006, 34(2): 282-286.

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}

{{article.copyrightLicense_en}}

PDF(220 KB)

Accesses

Citation

Detail

Sections

Recommended

/

〈

〉