Techniques of Leakage Current Optimization Based on Don’t Care Bits in Test Vectors
WANG Wei, HAN Yin-he, LI Xiao-wei, ZHANG You-sheng
Acta Electronica Sinica ›› 2006, Vol. 34 ›› Issue (2) : 282-286.
Techniques of Leakage Current Optimization Based on Don’t Care Bits in Test Vectors
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