A New Noise Parameter Measurement Method for GaAs FET/pHEMT Devices
LIU Zhang-wen, JIANG Yi, GU Tian-xiang
Acta Electronica Sinica ›› 2006, Vol. 34 ›› Issue (2) : 352-355.
A New Noise Parameter Measurement Method for GaAs FET/pHEMT Devices
{{custom_ref.label}} |
{{custom_citation.content}}
{{custom_citation.annotation}}
|
/
〈 | 〉 |