A New Noise Parameter Measurement Method for GaAs FET/pHEMT Devices

A New Noise Parameter Measurement Method for GaAs FET/pHEMT Devices

LIU Zhang-wen, JIANG Yi, GU Tian-xiang

ACTA ELECTRONICA SINICA ›› 2006, Vol. 34 ›› Issue (2) : 352-355.

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ACTA ELECTRONICA SINICA ›› 2006, Vol. 34 ›› Issue (2) : 352-355.

A New Noise Parameter Measurement Method for GaAs FET/pHEMT Devices

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2006, 34(2): 352-355.

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