Automatic Test Pattern Generation with Estimation of Distribution Algorithms for Combinational Circuits

Automatic Test Pattern Generation with Estimation of Distribution Algorithms for Combinational Circuits

ZHAO Zhong-yu, PENG Yu, PENG Xi-yuan

ACTA ELECTRONICA SINICA ›› 2006, Vol. 34 ›› Issue (S1) : 2384-2386.

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PDF(454 KB)

ACTA ELECTRONICA SINICA ›› 2006, Vol. 34 ›› Issue (S1) : 2384-2386.

Automatic Test Pattern Generation with Estimation of Distribution Algorithms for Combinational Circuits

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2006, 34(S1): 2384-2386.

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