Research on Model Driven Test Modeling of EJB Component
DENG Xiong, CHANG Chuang-ye, WU Ji, JIN Mao-zhong, LIU Chao
Acta Electronica Sinica ›› 2006, Vol. 34 ›› Issue (S1) : 2467-2472.
Research on Model Driven Test Modeling of EJB Component
{{custom_ref.label}} |
{{custom_citation.content}}
{{custom_citation.annotation}}
|
/
〈 | 〉 |