Robust Well-Conditioned Waveform Evaluation Based on Higher Order Vector FE/BI Method

Robust Well-Conditioned Waveform Evaluation Based on Higher Order Vector FE/BI Method

BAN Yong-ling, NIE Zai-ping, YU Zhe-feng

ACTA ELECTRONICA SINICA ›› 2007, Vol. 35 ›› Issue (1) : 170-174.

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ACTA ELECTRONICA SINICA ›› 2007, Vol. 35 ›› Issue (1) : 170-174.

Robust Well-Conditioned Waveform Evaluation Based on Higher Order Vector FE/BI Method

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2007, 35(1): 170-174.

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