A Test Set Compression Algorithm Based on Variable-Run-Length Code

A Test Set Compression Algorithm Based on Variable-Run-Length Code

PENG Xi-yuan;YU Yang

ACTA ELECTRONICA SINICA ›› 2007, Vol. 35 ›› Issue (2) : 197-201.

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PDF(355 KB)

ACTA ELECTRONICA SINICA ›› 2007, Vol. 35 ›› Issue (2) : 197-201.

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A Test Set Compression Algorithm Based on Variable-Run-Length Code

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2007, 35(2): 197-201.

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