Measurement and Evaluation of Micro-Sized Strain Fields in GaN Epitaxial Structure

WANG Jun-zhong;JI Yuan;TIAN Yan-bao;NIU Nan-hui;XU Chen;HAN Jun;GUO Xia;SHEN Guang-di

ACTA ELECTRONICA SINICA ›› 2008, Vol. 36 ›› Issue (11) : 2139-2143.

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ACTA ELECTRONICA SINICA ›› 2008, Vol. 36 ›› Issue (11) : 2139-2143.
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Measurement and Evaluation of Micro-Sized Strain Fields in GaN Epitaxial Structure

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2008, 36(11): 2139-2143.

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