A Test Scheme Based on RAS Structure to Reduced Test Volume and Time

A Test Scheme Based on RAS Structure to Reduced Test Volume and Time

LIANG Hua-guo;ZHU Shen-cai;CHEN Tian;ZHANG Nian

ACTA ELECTRONICA SINICA ›› 2008, Vol. 36 ›› Issue (12) : 2418-2422.

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PDF(313 KB)

ACTA ELECTRONICA SINICA ›› 2008, Vol. 36 ›› Issue (12) : 2418-2422.

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A Test Scheme Based on RAS Structure to Reduced Test Volume and Time

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