A Measurement Method of Low Close-in Carrier Phase-Noise for the Frequency Synthesizer with High Stability

LI Feng-lin, CHEN Bai-xiao, ZHANG Shou-hong

ACTA ELECTRONICA SINICA ›› 2008, Vol. 36 ›› Issue (3) : 594-598.

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ACTA ELECTRONICA SINICA ›› 2008, Vol. 36 ›› Issue (3) : 594-598.

A Measurement Method of Low Close-in Carrier Phase-Noise for the Frequency Synthesizer with High Stability

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2008, 36(3): 594-598.

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