The Defects Diagnose of Pile Foundation Based on Two-layer Multiple-Classifier of SVM

KANG Wei-xin, PENG Xi-yuan

ACTA ELECTRONICA SINICA ›› 2008, Vol. 36 ›› Issue (S1) : 66-70.

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ACTA ELECTRONICA SINICA ›› 2008, Vol. 36 ›› Issue (S1) : 66-70.

The Defects Diagnose of Pile Foundation Based on Two-layer Multiple-Classifier of SVM

  • KANG Wei-xin, PENG Xi-yuan
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Abstract

For studying the rapid and accurate classification method of pile foundation defects,a multi-layer classification method is adopted to improve one -to-one support vector machine(SVM)multiple classifiers structure,build one-to-one two-layer classification model and propose two-layer multiple classification method based on SVM theory.Compared with the BP neural network,the learning and training of two-layer SVM classification is faster and the real-time of the classification processing is better.In addition,it has stronger adaptability in test environment based on small sample and better classification accuracy.The method is fit for analyzing the multi-category classification problem of defects diagnose of pile foundation such as smaller training samples,higher precise and more input and output classification variables,and provides important support to the recognition of pile foundation which had several defects.

Key words

pile foundations / support vector machine(SVM) / multi2classification / defects diagnose / neural network

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KANG Wei-xin, PENG Xi-yuan. The Defects Diagnose of Pile Foundation Based on Two-layer Multiple-Classifier of SVM[J]. Acta Electronica Sinica, 2008, 36(S1): 66-70.

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