Cobalt-60 Experiment on Ionization Radiation Effects of Charge Coupled Devices

TANG Ben-qi;WANG Zu-jun;LIU Min-bo;XIAO Zhi-gang;ZHANG Yong;HUANG Shao-yan

ACTA ELECTRONICA SINICA ›› 2010, Vol. 38 ›› Issue (5) : 1192-1195.

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ACTA ELECTRONICA SINICA ›› 2010, Vol. 38 ›› Issue (5) : 1192-1195.
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Cobalt-60 Experiment on Ionization Radiation Effects of Charge Coupled Devices

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2010, 38(5): 1192-1195.

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