Reliability Evaluation for TWT with Small Samples

Reliability Evaluation for TWT with Small Samples

FAN He-hong;LIU Pan;ZHAO Xing-qun &SUN Xiao-han

ACTA ELECTRONICA SINICA ›› 2010, Vol. 38 ›› Issue (6) : 1394-1398.

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ACTA ELECTRONICA SINICA ›› 2010, Vol. 38 ›› Issue (6) : 1394-1398.

Reliability Evaluation for TWT with Small Samples

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2010, 38(6): 1394-1398.

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