Computed Laminography Imaging Inspection Method for Plate-Shell Microelectronic Devices

Computed Laminography Imaging Inspection Method for Plate-Shell Microelectronic Devices

FU Jian;WANG Hong-jun;LI Bin;JIANG Bai-hong

ACTA ELECTRONICA SINICA ›› 2010, Vol. 38 ›› Issue (7) : 1580-1584.

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ACTA ELECTRONICA SINICA ›› 2010, Vol. 38 ›› Issue (7) : 1580-1584.

Computed Laminography Imaging Inspection Method for Plate-Shell Microelectronic Devices

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2010, 38(7): 1580-1584.

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