
An Integrity Check Method for Fine-Grained Data Based on Finite Projective Geometry
CHEN Long;LOU Xiao-hui;WANG Guo-yin
ACTA ELECTRONICA SINICA ›› 2011, Vol. 39 ›› Issue (12) : 2850-2855.
An Integrity Check Method for Fine-Grained Data Based on Finite Projective Geometry
{{custom_ref.label}} |
{{custom_citation.content}}
{{custom_citation.annotation}}
|
/
〈 |
|
〉 |