
AMUR:An Adaptive Measuring Algorithm of Underlying Uncertainty for RFID Data
WANG Yong-li;QIAN Jiang-bo;SUN Shu-rong;ZHANG Gong-xuan;LIU Dong-mei
ACTA ELECTRONICA SINICA ›› 2011, Vol. 39 ›› Issue (3) : 579-584.
AMUR:An Adaptive Measuring Algorithm of Underlying Uncertainty for RFID Data
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