Test Quality Evaluation for Delay Test Pattern Based on Output Violation Probability

WANG Jie;LIANG Hua-guo;LI Hua-wei;MIN Ying-hua;LI Xiao-wei

ACTA ELECTRONICA SINICA ›› 2011, Vol. 39 ›› Issue (5) : 1031-1036.

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ACTA ELECTRONICA SINICA ›› 2011, Vol. 39 ›› Issue (5) : 1031-1036.
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Test Quality Evaluation for Delay Test Pattern Based on Output Violation Probability

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2011, 39(5): 1031-1036.

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