Reliability Assessment for Long-Life Products Based on ADT with Tightened Critical Values

Reliability Assessment for Long-Life Products Based on ADT with Tightened Critical Values

FENG Jing

ACTA ELECTRONICA SINICA ›› 2011, Vol. 39 ›› Issue (6) : 1253-1256.

PDF(687 KB)

PDF(687 KB)

ACTA ELECTRONICA SINICA ›› 2011, Vol. 39 ›› Issue (6) : 1253-1256.

Reliability Assessment for Long-Life Products Based on ADT with Tightened Critical Values

{{article.zuoZhe_EN}}

Author information +

History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

Download Citations

{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2011, 39(6): 1253-1256.

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}

{{article.copyrightLicense_en}}

PDF(687 KB)

Accesses

Citation

Detail

Sections

Recommended

/

〈

〉