The Breakdown Character of Thin Oxide Film and Critical Trap Density

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- The Breakdown Character of Thin Oxide Film and Critical Trap Density
- Acta Electronica Sinica Vol. 28, Issue 8, Pages: 59-62(2000)
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The Breakdown Character of Thin Oxide Film and Critical Trap Density[J]. Acta Electronica Sinica, 2000, 28(8): 59-62.
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The Breakdown Character of Thin Oxide Film and Critical Trap Density[J]. Acta Electronica Sinica, 2000, 28(8): 59-62. DOI：

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