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Work Function of Tungsten Carbide Thin Film Calculated Using Field Emission Microscopy
更新时间:2025-07-16
    • Work Function of Tungsten Carbide Thin Film Calculated Using Field Emission Microscopy

    • Acta Electronica Sinica   Vol. 30, Issue 5, Pages: 655-657(2002)
    • CLC: TN304
    • Published:2002

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  • SUN Jian-ping, ZHANG Zhao-xiang, HOU Shi-min, et al. Work Function of Tungsten Carbide Thin Film Calculated Using Field Emission Microscopy[J]. Acta Electronica Sinica, 2002, 30(5): 655-657. DOI:

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