Characteristic Analysis for CPW's on Thin Substrate

ZHAO Ji-xiang; MAO Jun-fa

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Characteristic Analysis for CPW's on Thin Substrate

更新时间：2025-07-16

- Characteristic Analysis for CPW's on Thin Substrate
- Acta Electronica Sinica Vol. 31, Issue 12, Pages: 1891-1893(2003)
- 作者机构：
  
  上海交通大学电子工程系,上海,200030
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN811.2
- Published：2003
- 稿件说明：
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ZHAO Ji-xiang, MAO Jun-fa. Characteristic Analysis for CPW's on Thin Substrate[J]. Acta Electronica Sinica, 2003, 31(12): 1891-1893.
DOI：

ZHAO Ji-xiang, MAO Jun-fa. Characteristic Analysis for CPW's on Thin Substrate[J]. Acta Electronica Sinica, 2003, 31(12): 1891-1893. DOI：

摘要

本文推导出了薄衬底共面波导特性参数计算的近似解析表达式

避免了薄衬底保角变换中的"拥挤现象".利用该表达式并结合部分电容法可以计算在导体与衬底之间加薄绝缘层的共面波导的特性参数

分析结果与实验数据相符合.最后还对有薄绝缘层的硅衬底共面波导的损耗因子进行了分析.

Abstract

To avoid the "crowding phenomenon" in conformal mapping

approximate analytical expressions of characteristic parameter for CPW's on a thin substrate have been derived.Combining these expressions with the partial capacitance method

we can calculate the characteristic parameters for CPW's with a thin insulative film between the conductors and substrate.A practical example is analyzed and agrees well with the test data.Finally the effect of an insulated thin film between the conductors and Si-substrate on loss factor of microwave transmission lines is analyzed.

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