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Survey on Path-Wise Automatic Generation of Test Data
更新时间:2025-07-16
    • Survey on Path-Wise Automatic Generation of Test Data

    • Acta Electronica Sinica   Vol. 32, Issue 1, Pages: 109-113(2004)
    • CLC: TP311
    • Published:2004

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  • SHAN Jin-Hui, WANG Ji, QI Zhi-Chang. Survey on Path-Wise Automatic Generation of Test Data[J]. Acta Electronica Sinica, 2004, 32(1): 109-113. DOI:

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